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. 2025 Nov 27;15(23):1789. doi: 10.3390/nano15231789
AFM Atomic Force Microscopy
MaCE Metal-assisted Chemical Etching
MOVPE Metal–Organic Vapour Phase Epitaxy
EDS Energy-Dispersive X-ray Spectroscopy
RIE Reactive Ion Etching
SEM Scanning Electron Microscope
SSD Solid-State Dewetting