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. 2025 Dec 12;16(12):1401. doi: 10.3390/mi16121401
UHNA Ultra-High Numerical Aperture
PIC Photonic integrated circuits
QKD Quantum key distribution
SOI Silicon-on-insulator
MPW Multi-Project Wafer
DUV Deep ultraviolet
FDE Finite-difference eigenmode
FDTD Finite-difference time-domain
FAU Fiber array unit
DRIE Deep reactive ion plasma etching
RIE Reactive ion plasma etching
ICP Inductively Coupled Plasma
OFDR Optical frequency domain reflectometry
SMF Single-Mode Fiber