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. 2005 Oct 31;102(45):16293–16296. doi: 10.1073/pnas.0506328102

Fig. 4.

Fig. 4.

Spatular pull-off forces on glass and N-phob vs. humidity at ambient temperature. The straight line corresponds to the calculations following Eq. 4. (Inset) The increase Δh in water-film thickness on a Si wafer with increasing humidity as measured by ellipsometry.