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. 2026 Feb 25;13:10. doi: 10.1186/s40580-026-00540-6

Table 3.

Comparison of SNSPD and TES operating at ~ 1550 nm. For SNSPDs, since (engineering) trade-offs and optimization required for a specific metric often prevent a single device from achieving peak performance across all categories, we show figures of merit of the state-of-the-art SNSPD exhibiting approximately 90% system detection efficiency or higher, along with PNR capability, low timing jitter, and/or high count rates

Type SNSPD (NbTiN) [188]) SNSPD (NbN) [189] SNSPD (NbN, 32 pixels) [195] SNSPD (NbTiN, 28 pixels) [191] TES (W) [128]
System detection efficiency

99.5%@1350 nm

94%@1500 nm

97.4%@1550 nm, 98.2%@1590 nm 97.5%@1555 nm 88%@1550 nm 97%
Dark count rate 300–500 cps  < 100 cps 20 cps 60 cps  < 0.1 cps*
Timing jitter 30 ps 66 ps 382 ps (for 1 photon), 40.4 ps (for 32 photons)  < 80 ps 58 ns*
Maximum count rate  ~ 10 Mcps** 20 Mcps** 41.7 Mcps**  ~ 250 Mcps** (> 1 Gcps with 4 chips)  > 1 MHz
PNR capability No No Pseudo-PNR (8 photons) Pseudo-PNR (8 photons) True-PNR (7 photons)
Operating temperature 2.7 K 0.8 K 0.85 K 0.8 K 0.012 K

* Values inferred from [218] and [211]

** Count rate at -3 dB efficiency