AR/VR	Augmented Reality/Virtual Reality
BEOL	Back-End-of-Line
BI	Back-Illuminated
CIS	CMOS Image Sensor
CMOS	Complementary Metal-Oxide-Semiconductor
DCR	Dark Count Rate
DNW	Deep Nwell
FEOL	Front-End-of-Line
FI	Front-Illuminated
FWHM	Full Width at Half Maximum
FWTM	Full Width at Tenth Maximum
GR	Guard Ring
LET	Light Emission Test
LiDAR	Light Detection and Ranging
NIR	Near-Infrared
NW	Nwell
PDP	Photon Detection Probability
PEB	Premature Edge Breakdown
PW	Pwell
SPAD	Single-Photon Avalanche Diode
TCAD	Technology Computer-Aided Design
TCSPC	Time-Correlated Single-Photon Counting
ToF	Time of Flight