Fig. 6. HAADF-STEM image (left) and corresponding EDX mapping for (a) as-annealed, (b) gated and (c) low-frequency cycled Si/Ti/Au/Ni–Co oxide sample. HRTEM and corresponding FFT (inset) from the top (d) and bottom (e) regions of the sample in the gated state. The spots enclosed in the yellow circles in (d) have interplanar distances compatible with (200) FCC-Co, while the green circles in (e) enclose spots whose interplanar distances match the (220) (Co,Ni)Si₂ phase.