| 2D | Two-dimensional |
| AFM | Atomic force microscopy |
| MFM | Magnetic force microscopy |
| KPFM | Kelvin probe force microscopy |
| XRD | X-ray diffraction |
| UV | Ultraviolet |
| MIS | Metal–insulator–semiconductor |
| 2D | Two-dimensional |
| AFM | Atomic force microscopy |
| MFM | Magnetic force microscopy |
| KPFM | Kelvin probe force microscopy |
| XRD | X-ray diffraction |
| UV | Ultraviolet |
| MIS | Metal–insulator–semiconductor |