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. 2005 Dec 16;102(52):18932–18937. doi: 10.1073/pnas.0509469102

Table 1. Data collection and refinement statistics.

Crystal data
    Space group I4 I4
    Unit cell, Å a = 93.9 a = 88.5
c = 77.7 c = 79.9
X-ray data collection statistics
    Wavelength, Å 1.11 1.11
    Resolution, Å 60-2.3 60-1.68
    Total reflections 96,055 322,170
    Unique reflections 15,512 34,033
    Redundancy (last shell) 2.1 18.6 (7.9)
    Completeness (last shell), % 95.4 (86.0) 96.8 (83.2)
    Rsym, % 8.7 7.7
    I/σ (last shell) 13 (2.0) 26.1 (3.3)
Crystallographic refinement statistics
    Resolution, Å 40-2.3 40-1.68
    Reflections in working set 14,387 34,031
    Reflections in test set (5.0%) 1,440 (10%) 1,665 (5%)
    Rcryst, % 18.8% 18.4%
    Rfree, % 22.6% 19.3%
    RMSD bonds, Å 0.007 0.008
    RMSD angles, ° 1.06 1.11
    Average B factors, Å2 56.6 17.1

RMSD is the rms deviation from ideal geometry. Rsym = ΣhklΣi | Ilhkl,i 〈|hkl,i| 〉|I ΣhklΣiI| | |hkl,i| |, where 〈|hkl,i| 〉 is the average intensity of the multiple hkl observations for symmetry-related reflections. Rcryst = Σ | Fobs - Fcalc | ΣFobs, where Fobs and Fcalc are observed and calculated structure factors, Rfree is calculated from a randomly chosen 5% or 10% of reflections, and Rcryst is calculated over the remaining reflections.