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. 2005 Dec 10;6:294. doi: 10.1186/1471-2105-6-294

Figure 3.

Figure 3

Algorithm to detect compact defects. Outliers (B) are declared based on the distribution function of the E (A). Then, clusters of outliers are identified with a FloodFill algorithm (C), and a size threshold is applied to eliminate clusters made of single or only a few pixels (D).