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. 2026 Jul 22;16(14):2270. doi: 10.3390/ani16142270
AFM Atomic force microscopy
CIT Indentation creep index
DTG Derivative thermogravimetry
FTIR Fourier-transform infrared spectroscopy
KOH Potassium hydroxide
SEM Scanning electron microscopy
TG Thermogravimetry
TGA Thermogravimetric analysis
XPS X-ray photoelectron spectroscopy