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. 2026 Jul 14;19(14):3027. doi: 10.3390/ma19143027
AFM Atomic Force Microscopy
ATR Attenuated Total Reflectance
BDD Boron-Doped Diamond
BDND Boron-Doped Nanocrystalline Diamond
B/C Boron-to-Carbon ratio
CVD Chemical Vapor Deposition
FTIR Fourier Transform Infrared Spectroscopy
HFCVD Hot Filament Chemical Vapor Deposition
IDF International Diabetes Federation
LIBAD Low Incident Beam Angle Diffraction
MCD Microcrystalline Diamond
NCD Nanocrystalline Diamond
Rms Root Mean Square roughness
Sa Arithmetic mean surface roughness
sccm Standard Cubic Centimeters per Minute
SEM Scanning Electron Microscopy
S/N Signal-to-Noise ratio
Ts Substrate temperature
XPS X-ray Photoelectron Spectroscopy
XRD X-ray Diffraction