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. 2026 Sep 11;17(9):1077. doi: 10.3390/mi17091077
AR coating Antireflection coating
SEM Scanning electron microscopy
sccm Standard cubic centimeter per minute
UV-Vis-NIR Ultraviolet–visible–near-infrared
EDS Energy-dispersive X-ray spectroscopy
SD Standard deviation
RSD Relative standard deviation