Skip to main content
. 2026 Sep 20;18(18):2305. doi: 10.3390/polym18182305
μSBS Micro-shear bond strength
SLA Stereolithography
DLP Digital light processing
CNC Computer numerical control
AM Additive manufacturing
Y-TZP Yttria-stabilized tetragonal zirconia polycrystal
STL Standard tessellation language
SEM Scanning electron microscope
ANOVA One-way analysis of variance