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. 2005 Jul 29;6(8):708–718. doi: 10.1631/jzus.2005.B0708

Table 12.

Evaluation of suspended dust samples and their components (major, minor and trace elements) in ferrosilicon production unit from May 2000 to Aug. 2001

Date FeSi (mg/m3) Concentration
SiO2 (%) Al2O3 (%) CaO (%) MgO (%) K2O (%) Na2O (%) Mn (×10−6) Co (×10−6) Ni (×10−6) Pb (×10−6) Fe (×10−6)
May 2000 65.0 90.6 0.43 0.35 0.50 0.60 0.40 315.50 78.95 4.70 BD 285.3
Aug. 2000 40.0 91.7 0.47 0.30 0.48 0.57 0.38 420.60 70.90 5.40 BD 130.5
Nov. 2000 17.0 89.5 0.30 0.19 0.40 0.53 0.30 310.30 60.30 3.50 BD 100.0
Feb. 2001 26.0 91.7 0.37 0.23 0.37 0.48 0.28 370.60 85.40 7.40 BD 100.3
May 2001 38.0 92.0 0.40 0.27 0.55 0.40 0.33 410.70 90.30 4.70 BD 989.5
Aug. 2001 53.0 93.6 0.35 0.25 0.60 0.50 0.25 530.60 88.70 8.00 BD 981.0
Mean 35.8 91.5 0.45 0.27 0.50 0.51 0.32 393.05 80.40 5.60 BD 431.0

BD: Below detection limit