Table 1.

Open time constants

mV	τlong (ms)	Along	τshort (ms)	Ashort	r	n	Events
Control
−60	5.8	66%	1.8	34%	0.97	6	8768
−70	10.5	39%	2.3	61%	0.97	8	17353
−80	16.8	12%	3.2	88%	0.96	8	5350
−90	19.3	23%	3.0	77%	0.91	6	3924
−100	30.0	12%	3.2	88%	0.91	5	2052
ZD7288 (50 μm)
−60	17.5*	7%*	1.8	93%*	0.96	3	3208
−70	14.5†	9%*	1.9*	91%*	0.97	6	7714
−80	16.8	8%*	1.5*	92%*	0.97	9	7695
−90	12.8*	12%*	1.3*	88%*	0.94	7	6069
−100	13.4*	19%*	1.0*	81%*	0.90	2	1387
CsCl (1 mm)
−60		n.d.		n.d.
−70	6.6*	20%*	0.8*	80%*	0.91	4	1695
−80	1.7*	41%*	0.4*	59%*	0.96	1	2712
−90	1.2*	48%*	0.4*	52%*	0.98	1	5036
−100		n.d.		n.d.

Open times were calculated from standard exponential fits of distribution histograms (bin width = 1 ms for control and ZD7288; bin width = 0.5 ms for CsCl). Abbreviations: τ, time constant; A, area that τ_long or τ_short contributes to the exponential fit; r, correlation coefficient of exponential fit; n, number of patches; n.d., not determined. Voltages corrected for patch configuration. Significance was determined with unpaired t tests.

^*P≤ 0.001

^†P≤ 0.01 versus control patches.