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. 2003 Mar;185(5):1555–1563. doi: 10.1128/JB.185.5.1555-1563.2003

FIG. 6.

FIG. 6.

Electron microscopy analysis of the spore surface of parental strains and complemented deletion mutants after negative staining (see the legend to Fig. 5 for details). (A) Parental strain 7702; (D) strain 7702 ΔbclA eag::bclA7702 (PF31); (E) strain 7702 ΔbclA eag::bclA9602 (PF34); (B) parental strain 9602R; (G) strain 9602R ΔbclA eag::bclA7702 (PF32); (H) strain 9602R ΔbclA eag::bclA9602 (PF33); (I) parental strain RA3R; (K) strain RA3R ΔbclA eag::bclA7702 (PF35); (L) strain RA3R ΔbclA eag::bclA9602 (PF36). Bar, 100 nm.