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. Author manuscript; available in PMC: 2006 Nov 2.
Published in final edited form as: Biometrics. 2006 Sep;62(3):803–812. doi: 10.1111/j.1541-0420.2005.00521.x

Table 2.

Estimated powers of nominal 0.05-level tests for proportional hazards of Si in the model λ(t|Si) = λ0(t) exp{Siγ(t)}, i = 1, 2, . . . , n, expressed as percent. λ0(t) = 1; Si is a single binary covariate defining two groups of equal size; γ(t) is the true alternative; n = 200. Censoring distribution is uniform on (0, 2). Tests and alternatives are as described in the text. Results are based on 1000 simulations for each scenario. The maximum binomial (N = 1000, p = 0:50) standard error for the entries is 1:58%.

Alternative
Test Curve 1 Curve 2 Curve 3 Curve 4 Curve 5
Spline-based 90.8 78.4 47.6 37.3 28.6
Linear 90.5 78.8 51.4 10.1 30.4
Quadratic 79.7 65.3 50.0 13.8 36.6
Log 93.3 75.8 37.4 32.1 15.5
Optimal 93.3 81.7 51.4 91.5 46.6