Estimated powers of nominal 0.05-level tests for covariate effects of Si in the model λ(t|Si) = λ0(t) exp{γ(Si)}, i = 1, 2, . . . , n, expressed as percent. λ0(t) = 1; values of Si are equally spaced on the interval [−1.719, 1.719] with step 0.0173; γ(Si) is the true alternative; n = 200. Censoring distribution is uniform on (0, 1.5). Tests and alternatives are as described in the text. Results are based on 1000 simulations for each scenario. The maximum binomial (N = 1000, p = 0.50) standard error for the entries is 1.58%.