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. Author manuscript; available in PMC: 2006 Nov 2.
Published in final edited form as: Biometrics. 2006 Sep;62(3):803–812. doi: 10.1111/j.1541-0420.2005.00521.x

Table 4.

Estimated powers of nominal 0.05-level tests for covariate effects of Si in the model λ(t|Si) = λ0(t) exp{γ(Si)}, i = 1, 2, . . . , n, expressed as percent. λ0(t) = 1; values of Si are equally spaced on the interval [−1.719, 1.719] with step 0.0173; γ(Si) is the true alternative; n = 200. Censoring distribution is uniform on (0, 1.5). Tests and alternatives are as described in the text. Results are based on 1000 simulations for each scenario. The maximum binomial (N = 1000, p = 0.50) standard error for the entries is 1.58%.

Alternative
Null hypothesis Test E L S1 Q C S2
No effect Spline-based 74.0 72.4 73.8 23.1 5.8 16.2
Linear 74.4 71.5 68.9 4.5 4.3 4.2
Quadratic 71.5 60.4 84.1 73.6 5.9 44.7
Cubic 67.2 55.5 84.1 67.7 6.2 38.5
Optimal 81.6 74.2 96.3 81.7 92.0 93.7
Linear effect Spline-based 12.8 4.9 56.0 80.7 7.7 65.4
Quadratic 13.7 4.9 54.0 81.7 6.9 58.5
Cubic 12.0 7.5 54.0 73.7 6.7 46.4
Optimal 14.2 10.5 78.3 81.7 91.9 93.8