FIGURE A4.
(a) Half-width of lateral signal loop Wo on both the tilted (Wo(θ), θ ∼20°) and horizontal (Wo(0)) mica substrates as a function of applied normal force using an OH-SAM functionalized microsized probe tip (R ∼2.5 μm, nominal cantilever spring constant, k ∼0.12 N/m). (b) Lateral signal baseline offset jump (Δo(θ) – Δo(0)) as a function of applied normal force. Each data point represents eight independent scan loops under a fixed applied normal force in panel a, and two pairs of eight independent scan loops under a fixed applied normal force on the tilted and horizontal mica substrates in panel b.