Scanning electron microscopy of gamma radiation-exposed capsule regions. Yeast cells with induced capsule were irradiated for 0, 5, 10, 20, 30, and 40 min and then used to prepare samples for scanning electron microscopy. Bar, 5 μm (0.5 μm for inset). Scanning electron micrographs of cells in which the capsule was not induced (H99 grown in Sab) and of the acapsular cap67 mutant served as controls.