Figure 2.

Numerical simulations of the dependence of the chemical yield ratios φ and φ′ for hole trapping and reactivity on the hopping and trapping rates in the duplex G⁺ACGTCTGACTCGACTGGG and C TGCAGACTGAGCTGACCC (N ≅ 7), where the G₁…GGG spacing is 54 Å; φ (solid line) and φ′ (dotted line) denote the ratios of yields for k = 10 with k_r/k = 0.008, k_d/k = 0.008, and k_t/k = 0.6.