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. 2000 Jun 6;97(12):6282–6286. doi: 10.1073/pnas.97.12.6282

Figure 1.

Figure 1

(A) Schematic of the experimental set-up used to measure the length and conductance of single gold nanowires. The figure depicts an AFM cantilever, coated with gold, making contact with a nanowire. A piezoelectric positioner moves the nanowire by Δp, which results in a deflection of the cantilever by Δc. During compression or extension cycles, the change in length of the nanowire is measured as Δl = Δp − Δc. The cantilever exerts a force F = kΔc on the nanowire, where k is the cantilever spring constant. Together with the changes in length, Δl, we also measure the nanowire conductance G. (B) An example of simultaneous recordings of Δl, G = I/V, and F obtained on compressing a gold nanowire.