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. 2000 Dec 19;97(26):14760–14765. doi: 10.1073/pnas.97.26.14760

Figure 3.

Figure 3

Interactions between Vj and Vm gating. (A) Effect of Vm on Vj dependence. Records of junctional currents (Ij) elicited by the same Vj steps (±100 mV by 20 mV increments and 30 s duration) applied at two holding potentials (Vm = 0 and −80 mV). The Vm difference changed junctional conductance from gj(0 mV) = 2.72 μS to gj (−80 mV) = 4.80 μS, but the junctional currents declined for increasing positive and negative Vj steps with similar characteristics (positive Ij are shown upward). (B) Plots of Gjss/Vj relations normalized to gj at 0 (○) and −80 mV (●) were essentially superimposable, indicating that Vj gating was little affected by Vm. (C) Effect of Vj on Vm dependence. Sample records of junctional currents (Ij) after subtraction of nonjunctional currents evoked by the same Vm protocol as in Fig. 1 for Vj = 0 (left) and Vj = +80 mV (right) in pairs expressing WT and truncated S257stop junctions. Conductances at the two holding potential were gj(Vj = 0) = 8.31 and gj(Vj = 80) = 1.57 μS for WT junctions and gj(Vj = 0) = 10.81 to gj(Vj = 80) = 1.27 μS for S257stop junctions. With Vj = 0 mV, equal depolarization of both cells equally decreased gj of WT and of S257stop junctions. However, when gj was reduced at Vj = +80 mV, Vm sensitivity of WT junctions was markedly reduced, whereas sensitivity of S257stop junctions in which the fast Vj gate was removed (18) was little affected. For comparison, current gains are increased for the Vj = +80 mV records. (D) Gjss/Vm relations of WT (○) and truncated S257stop (●) junctions for Vj = +80 where Gj is normalized to the value at Vm*. The curves are fits of the squared Boltzmann relations with parameters of Table 1. Each point represents mean values (±SEM) of four pairs. (E) Gating model for the combined Vj and Vm dependence of Cx43 junctions. See Discussion.