Interactions between Vj and
Vm gating. (A) Effect of
Vm on Vj
dependence. Records of junctional currents
(Ij) elicited by the same
Vj steps (±100 mV by 20 mV increments and
30 s duration) applied at two holding potentials
(Vm = 0 and −80 mV). The
Vm difference changed junctional conductance
from gj(0 mV) = 2.72 μS to
gj (−80 mV) = 4.80 μS, but the
junctional currents declined for increasing positive and negative
Vj steps with similar characteristics
(positive Ij are shown upward).
(B) Plots of
Gjss/Vj
relations normalized to gj at 0
(○) and −80 mV (●) were essentially
superimposable, indicating that Vj gating
was little affected by Vm.
(C) Effect of Vj on
Vm dependence. Sample records of junctional
currents (Ij) after subtraction of
nonjunctional currents evoked by the same Vm
protocol as in Fig. 1 for Vj = 0 (left)
and Vj = +80 mV (right) in pairs
expressing WT and truncated S257stop junctions. Conductances at the two
holding potential were
gj(Vj = 0)
= 8.31 and gj(Vj =
80) = 1.57 μS for WT junctions and
gj(Vj = 0) =
10.81 to gj(Vj =
80) = 1.27 μS for S257stop junctions. With
Vj = 0 mV, equal depolarization of both
cells equally decreased gj of WT and of
S257stop junctions. However, when gj was
reduced at Vj = +80 mV,
Vm sensitivity of WT junctions was markedly
reduced, whereas sensitivity of S257stop junctions in which the fast
Vj gate was removed (18) was little
affected. For comparison, current gains are increased for the
Vj = +80 mV records. (D)
Gjss/Vm relations of
WT (○) and truncated S257stop (●) junctions for
Vj = +80 where
Gj is normalized to the value at
Vm*. The curves are fits of the squared
Boltzmann relations with parameters of Table 1. Each point represents
mean values (±SEM) of four pairs. (E) Gating model for
the combined Vj and
Vm dependence of Cx43 junctions. See
Discussion.