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. 2005 Aug 31;61(Pt 9):831–833. doi: 10.1107/S1744309105023602

Table 1. Summary of crystallographic data.

Values in parentheses are for the outermost resolution shell (2.59–2.50 Å).

X-ray wavelength (Å) 0.97123 (Pohang beamline 4A)
Resolution range (Å) 30–2.5
Space group P43212 or P41212
Unit-cell parameters (Å) a = 99.88, b = 99.88, c = 144.59
Total/unique reflections 287950/25992
Completeness (%) 99.7 (99.1)
Mean I/σ(I) (%) 26.2 (4.4)
Rmerge (%) 0.080 (0.299)

R merge = Inline graphic Inline graphic, where I(hi) is the intensity of the ith measurement of reflection h and 〈I(h)〉 is the mean value of I(hi) for all i measurements.