TABLE 1.
Surface composition determined by XPS
Si3N4 | Amine | PEG | |
---|---|---|---|
C | 14.1 (1.1) | 13.7 (0.7) | 15.4 (1.8) |
N | 23.7 (0.8) | 23.8 (0.3) | 22.7 (0.8) |
O | 32.1 (0.5) | 32.6 (0.3) | 32.7 (0.8) |
Si | 30.1 (0.5) | 30.0 (0.6) | 29.2 (0.9) |
The elemental composition for each surface modification does not change significantly, because of the low surface concentration of the primary amines and PEG cross-linkers. Standard deviations are in parentheses.