Optical (A), scanning electron (B), and atomic force (C) micrographs of wavy, single-crystal Si ribbons. For A and C, 20-μm-wide and 100-nm-thick Si ribbons were used with PDMS prestrained to ≈28% for A and ≈23% for C. For B, 30-μm-wide, 150-μm-long, and 100-nm-thick Si ribbons were used with a PDMS prestrain of ≈15%.