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. 2007 Sep 20;26(20):4391–4401. doi: 10.1038/sj.emboj.7601855

Table 1.

Crystallographic data and refinement statistics

  CARM128−140 CARM128−507 CARM1140−480 SAH–CARM1140−480
Space group P4121 2 P622 2 I222 P21212
 
Unit cell parameters
a, b, c (Å) 46.1, 46.1, 201.3 136.0, 136.0, 125.3 73.8, 98.1, 207.1 74.5, 98.2, 206.05
Resolution (Å) 42.0–1.69 (1.74–1.69) 50–2.55 (2.63–2.55) 30.0–2.4 (2.46–2.4) 30.0–2.2 (2.25–2.20)
Unique reflections 25 232 21 499 28 039 74 162
Completeness (%) 99.4 (99.9) 99.1 (99.4) 99.0 (95.0) 99.5 (96.4)
Number of atoms 1870 2785 5233 11 400
Rcryst, Rfree (%)a 20.5 (25.5) 23.0 (26.9) 20.5 (26.5) 18.6 (23.9)
Bonds (Å)/angles (deg)b 0.011/1.2 0.015/1.6 0.012/1.4 0.015/1.5
Average B factor
18.6
46.8
45.0
32.1
Numbers in parentheses indicate statistics for the high-resolution data bin.
aR=Σhkl∣Fobs−Fcalc∣/Σhkl Fobs where Fobs and Fcalc are the observed and calculated structure factor amplitudes for reflection hkl, applied to the work (Rfactor) and test (Rfree) sets, respectively. For each data set, the test set contains 5% of the data set.
bR.m.s. deviations were calculated using Engh and Huber parameters (Engh and Huber, 1991).