Table 4.
Data collection statistics | |||||||||
---|---|---|---|---|---|---|---|---|---|
Wavelength (Å) | Resolution (highest shell) (Å) | Completeness (%) | Rsyma | f′ | f″ | ||||
0.9790 | 48.55–3.30 (3.42–3.30) | 99.9 (100) | 0.189 (0.767) | −8.7 | 5.9 | ||||
0.9794 | 48.31–3.80 (3.94–3.80) | 99.8 (100) | 0.123 (0.566) | −10.6 | 3.6 | ||||
0.9950 | 48.61–3.60 (3.73–3.60) | 99.8 (100) | 0.115 (0.533) | −3.6 | 0c | ||||
| |||||||||
Diffraction Ratios and Phasing Statistics | |||||||||
| |||||||||
Anomalous Diffraction Ratios | Anomalous Phasing Power | ||||||||
|
|||||||||
Wavelength (Å) | λ1 | λ2 | λ3 | λ1 | λ2 | λ3 | |||
| |||||||||
λ1=0.9790 | 0.1032 | 0.1186 | 0.1046 | 1.9 | 0.3 | 0.9 | |||
λ2=0.9794 | 0.1137 | 0.1540 | 0.9 | 0.9 | |||||
λ3=0.9950 | 0.0790 | 0c | |||||||
| |||||||||
Figure of Merit<m> | |||||||||
| |||||||||
Resolution (Å) | 14.2–9.0 | 9.03–7.0 | 7.08–6.0 | 6.01–5.3 | 5.31–4.8 | 4.81–4.4 | 4.43–4.1 | 4.13-4.0 | overall |
3 | 8 | 1 | 1 | 1 | 3 | 3 | |||
|
|||||||||
<m> | 0.83 | 0.82 | 0.78 | 0.73 | 0.70 | 0.66 | 0.58 | 0.52 | 0.67 |
Rsym = Σ|Ihkl − <Ihkl>|/Σ<Ihkl> where Ihkl = single value of measured intensity of hkl reflection, and <Ihkl> = mean of all measured value intensity of hkl reflection. Bijvoet measurements were treated as independent reflections for the MAD phasing data sets.
Values of f′ and f″ were initially estimated from an EXAFS scan and refined in SOLVE26.
Taken as the reference for phasing in SOLVE.