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. Author manuscript; available in PMC: 2008 Nov 1.
Published in final edited form as: J Am Soc Mass Spectrom. 2007 Aug 22;18(11):1945–1949. doi: 10.1016/j.jasms.2007.08.009

Figure 3.

Figure 3

Observed silicon surface ions from DIOS surfaces: (a) OSiH+ is observed using laser ablation and TOF-SIMS. (b) DIOS mass spectra showing ablated ions (Six+) off of native SiH porous silicon surface. Experimental spectra with an averaged of 20 laser shots with 140 mJ/cm2 per shot. Spectra calibrated using Na+ and Si10+. Note the presence of the octadecylamine analyte at 270 Da.