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. Author manuscript; available in PMC: 2008 Dec 1.
Published in final edited form as: DNA Repair (Amst). 2007 Aug 21;6(12):1829–1838. doi: 10.1016/j.dnarep.2007.07.002

Table 1.

UV-induced mutations in wild-type, rad30 and rev3 yeast strains.

rad30Δ
wild-type
rev3-L979F
rad30Δ
rev3-L979F
Freq. (×10−6)
88 [59 - 120]
200 [50 - 350]
200 [170 - 230]
540 [470 - 590]
Events Freq. Events Freq. Events Freq. Events Freq.
A-T to G-C 4 14 0 0 2 16 0 0
G-C to A-T 8 28 6 48 12  92c 10  220c
A-T to T-A 6 21 2 16 4 32 2 43
A-T to C-G 0 0 0 0 1 8 0 0
G-C to T-A 1 4 2 16 2 16 4  86c
Tandem bps 1 4 3 24 0 0 4  86c
Indelsa 3 11 4 32 0 0 2 43
Complexb 2 7 8  64c 5 48 3 65

Cells were exposed to 20 J/m2 of UVC.

Freq. represents mutation frequency. All mutation frequencies are (×10−6). Numbers in brackets represent one standard deviation.

a

One and two-base insertions and deletions were categorized as indels.

b

Multiple, closely spaced base substitutions and/or indels were categorized as complex mutations. One of the can1 isolates from the rad30Δ strain contained three single base changes within 30 base-pairs.

c

Significant difference (p < 0.05) from the REV3 strain. P-values were determined as described in the materials and methods.