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. 2003 Oct 15;22(20):5382–5389. doi: 10.1093/emboj/cdg531

Table I. X-ray diffraction data collection and refinement statistics.

Data collection
 
Resolution (Å) 20.0–2.5
Measured reflections 570 918
Unique reflections 33 852
Completeness (%, > –1σ)a 97.7 (96.0)
Rsym (%)a,b 5.3 (46.4)
Average I/σ(I)a
19.47 (1.9)
Refinement
 
Rworkc 0.260
Rfreec 0.302
Number of reflections [F > 2σ (F)] 28 067
Number of protein atoms 5549
Number of non-protein atoms 337
R.m.s.d.d bond length (Å) 0.009
R.m.s.d.d bond angles (°) 1.47
Average B-factors (Å2, main chain/side chain) 61.5/62.3
Ramachandran analysis most favored/allowed 82.8/17.2

aLast shell (2.59–2.5 Å resolution) value is in parentheses.

bRsym = Σhkli|Ihkl,i – <Ihkl>|]/Σhkl,i<Ihkl>, where Ihkl,i is the intensity of an individual measurement of the reflection with Miller indices h, k and l, and <Ihkl> is the mean intensity of the reflection.

cRwork = Σ||Fobs| – |Fcalc||/Σ|Fobs|, where Fobs and Fcalc are observed and calculated structure factor amplitudes. Rfree is equivalent to Rwork, except 5% of total reflections were set aside to test the progress of refinement.

dR.m.s.d., root mean square deviation from ideal geometry.