Table 1.
X-ray diffraction data and refinement statistics
| LepFNR | LepFNR·NADP+ | |
| Space group | P21 | P21 |
| Images collected (Δφ) | 138 (1°) | 196 (1°) |
| Wavelength (X-ray source) | 1.42 Å (MX1-LNLS) | 1.54 Å (Rotating anode) |
| Unit cell parameters | a = 65.11, b = 111.83, c = 89.91 (Å); β = 92.76°. | a = 67.16, b = 112.25, c = 92.39 (Å); β = 93.19°. |
| Resolution | 53.92-2.43 (2.55-2.43) Å | 35.65-2.70 (2.85-2.70) Å |
| Number of reflections | 133681 | 106433 |
| Number of unique reflections | 47770 | 34663 |
| Completeness | 97.5% (97.5%) | 92.2% (92.2%) |
| Redundancy | 2.8 (2.6) | 3.1 (2.5) |
| Rmerge | 0.049 (0.144) | 0.097 (0.434) |
| Rpim | 0.035 (0.110) | 0.063 (0.293) |
| I/σ (I) | 5.9 (2.3) | 11.7 (2.3) |
| Total number of atoms | 10229 | 10051 |
| Rfactor | 0.2113 | 0.261 |
| Rfree | 0.2792 | 0.297 |
| RMS bond lengths | 0.007 Å | 0.015 Å |
| RMS bond angles | 0.869° | 1.829° |
Values in brackets represent the values for each parameter in the highest resolution shell.
Rmerge = Σhkl Σi Ii(hkl) - ⟨I(hkl)⟩/Σhkl Σi Ii(hkl)
Rpim = Σhkl [1/(N-1)]1/2 Σi|Ii(hkl) - ⟨I(hkl)⟩|/Σhkl Σi Ii(hkl), where N is the redundancy measured.