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. 2001 Jun 11;153(6):1151–1160. doi: 10.1083/jcb.153.6.1151

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© 2001 The Rockefeller University Press

This article is distributed under the terms of an Attribution–Noncommercial–Share Alike–No Mirror Sites license for the first six months after the publication date (see http://www.rupress.org/terms). After six months it is available under a Creative Commons License (Attribution–Noncommercial–Share Alike 4.0 Unported license, as described at http://creativecommons.org/licenses/by-nc-sa/4.0/).

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EM and projection map of purified Tom40. (A) Survey view of negatively stained Tom40 particles. The image was filtered to the first zero of the electron microscope transfer function. (B and C) Statistical analysis of Tom40 particles. From electron micrographs a total of 1,550 Tom40 particles were extracted and subjected to multireference alignment. Based on eigenimage analysis, the data sets of the two most prominent groups were split into 20 classes. (B) Class averages of one pore particle images. (C) Group averages of the two pore classes. The numbers given for a specific class average represent the number of merged particle images. Group averages containing <10 particle images were omitted. Bars: (A) 20 nm; (B and C) 10 nm.