Table 4.

Summary of crystallographic analysis

	Pro12Ras	Val12Ras
Data Collection
Resolution limit, Å	1.7	1.9
No. of observed reflections	151,581	83,084
No. of uniqe reflections	17,463	12,666
Completeness, %	99	98.7
Rsym, %178	8.4	9.0
Refinement
Resolution range, Å	5–1.7	5–1.9
No. of reflections	16,413	11,593
Rcryst, %†	20.3	21.8
Rfree, %‡	26.1	27.4
rms bond length, Å	0.006	0.008
rms bond angle, °	1.0	1.1

¹⁷⁸R_sym = Σ_h Σ_i |I_hi − I_h|/Σ_hi, where I_hi is the scaled intensity of the ith symmetry-related observation of reflection h, and I_h is the mean value. 

^†R_cryst = Σ_h|F_oh − F_ch|/Σ_h F_oh, where F_oh and F_ch are the observed and calculated structure factor amplitudes for reflection h. 

^‡R-factor calculated for 10% of the randomly chosen reflections not included in the refinement.