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. 1998 Apr 1;111(4):565–581. doi: 10.1085/jgp.111.4.565

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Low and high open probability behavior. The traces in A show 20 s of a recording from a single channel patch voltage clamped at −100 mV starting 11 s after excision into 1.0 μM free Ca²⁺. The parallel lines mark a 32-s break in the continuously acquired recording. Approximately 19 s after patch excision (arrow), channel open probability decreased from ∼60% to <10%. During the same continuous recording, ∼63 s after patch excision (second arrow), channel open probability spontaneously increased to its starting level. B shows the open probability during 1-s intervals as a function of time after patch excision with the arrows indicating the switches in channel activity (same as A).