Table 1. Crystallographic data.
Values in parentheses are for the highest resolution shell.
| X-ray source | ALS beamline 8.2.2 |
| Wavelength (Å) | 1.0 |
| Space group | P6522 (or P6122) |
| Unit-cell parameters (Å, °) | a = b = 58.3, c = 229.3, α = β = 90, γ = 120 |
| Diffraction limit | 20.0–2.9 (3.00–2.90) |
| Redundancy | 15.4 (15.9) |
| Completeness (%) | 99.9 (100.0) |
| Rsym† (%) | 8.6 (49.5) |
| 〈I/σ(I)〉 | 25.7 (4.95) |
†
R
sym = 
, where Ii(hkl) is the intensity I for the ith measurement of a reflection with indices hkl and 〈I〉 is the weighted mean of all measurements of I.