Table 1. X-ray data-collection statistics for YlaN SeMet crystals.
Values in parentheses are for the highest resolution shell.
| Data set | Peak (λ1) | Inflection (λ2) | Remote (λ3) |
|---|---|---|---|
| Wavelength (Å) | 0.9795 | 0.9745 | 0.9802 |
| unit-cell parameters (Å, °) | a = 31.5, b = 42.7, c = 62.7, β = 92.4 | a = 31.5, b = 42.7, c = 62.4, β = 92.6 | a = 31.4, b = 42.7, c = 62.4, β = 92.4 |
| Resolution (Å) | 25–2.4 (2.5–2.4) | 25–2.4 (2.5–2.4) | 25–2.4 (2.5–2.4) |
| Reflection measured | 23940 (3486) | 23369 (3419) | 23363 (3424) |
| Unique reflections | 6626 (961) | 6582 (959) | 6576 (952) |
| Completeness (%) | 99.8 (99.8) | 99.7 (99.7) | 99.8 (99.6) |
| Redundancy | 3.6 (3.6) | 3.6 (3.6) | 3.6 (3.6) |
| I/σ(I) | 10.5 (2.6) | 9.8 (2.2) | 11.2 (1.8) |
| Rmerge† (%) | 7.9 (42.9) | 8.4 (50.9) | 9.0 (58.9) |
†
R
merge = 
, where Ii and Im are the observed intensity and mean intensity of related reflections, respectively.