FIGURE 12.
Data for force of adhesion on an intact region of the membrane surface and for manipulated (crushed) regions (100 and 170 nm deep as measured from original height of nanostructure) corresponding to removal of silica particles of 13 and 40 μm diameters and of an oxidized Si AFM-tip with a radius of curvature of ∼20 nm. The error bars represent the 95% confidence limits.