FIGURE 5.
AFM topographic images of (A1 and A2) DPPC and (B1 and B2) GM1 monolayers transferred at 30 mN/m (z-scale 5 nm). Section analysis insets show height differences among the sections (note: lighter in color corresponds to greater height). The dark hole in image (A2) DPPC and (B2) GM1 is a scratched area where the local material was removed by rapidly scanning (20 Hz) a 150 × 150 nm2 square at high force with the AFM tip. Resulting section analysis insets indicate the total height of the monolayer.