Table 5.
Experimental distances used for modeling the rhodopsin helical bundle
| Helix1 | Helix2 | Residue1 | Residue2 | Minimum distance | Maximum distance | Experimental method | Reference |
| C | F | 139 | 248 | 6 | 20 | Dipolar SDSL-EPRa | Farrens et al. 1996 |
| C | F | 139 | 249 | 9 | 26 | Dipolar SDSL-EPRa | Farrens et al. 1996 |
| C | F | 139 | 250 | 9 | 26 | Dipolar SDSL-EPRa | Farrens et al. 1996 |
| C | F | 139 | 251 | 6 | 20 | Dipolar SDSL-EPRa | Farrens et al. 1996 |
| C | F | 139 | 252 | 9 | 26 | Dipolar SDSL-EPRa | Farrens et al. 1996 |
| A | G | 65 | 316 | 4 | 19 | Dipolar SDSL-EPRa | Yang et al. 1996 |
| E | F | 204 | 276 | 4 | 8 | Disulfide mappingb | Yu et al. 1995 |
| C | E | 140 | 222 | 4 | 8 | Disulfide mappingb | Yu et al. 1999 |
| C | E | 140 | 225 | 4 | 8 | Disulfide mappingb | Yu et al. 1999 |
| C | F | 135 | 250 | 4 | 8 | Disulfide mappingb | Yu et al. 1999 |
| C | E | 136 | 222 | 4 | 8 | Disulfide mappingb | Cai et al. 1997 |
| C | E | 136 | 225 | 4 | 8 | Disulfide mappingb | Cai et al. 1997 |
| B | C | 71 | 134 | 9 | 13 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| B | C | 90 | 116 | 5 | 10 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| B | D | 71 | 153 | 5 | 10 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| B | D | 86 | 172 | 15 | 20 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| C | E | 136 | 226 | 6 | 9 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| C | E | 125 | 215 | 6 | 9 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| D | E | 152 | 225 | 18 | 22 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| E | F | 216 | 258 | 9 | 13 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| F | G | 253 | 305 | 6 | 8 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| F | G | 264 | 298 | 6 | 8 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| A | G | 39 | 286 | 9 | 14 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| C | F | 114 | 268 | 14 | 18 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| D | F | 171 | 268 | 17 | 20 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| B | F | 73 | 250 | 10 | 15 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| A | F | 62 | 250 | 16 | 20 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
| A | F | 47 | 264 | 16 | 19 | Electron diffractionc | Unger and Schertler 1995; Yeagle et al. 2001 |
Helices A, B, C, D, E, F, G correspond to residues 33–65, 70–101, 105–140, 149–173, 199–226, 245–278, and 284–309, respectively.
a Reported distance ranges were adjusted to account for the error involved in using spin–spin distances as Cα–Cα distances as described in the text.
b Cα–Cα distances from disulfide mapping were set to 5.68 Å ± (reported error) as described in the text.
c Cα–Cα distances correspond to distances measured from the top, middle, and bottom of consecutive helices as described by Yeagle et al. (2001).