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. 2007 Apr 20;63(Pt 5):430–433. doi: 10.1107/S1744309107018271

Table 1. Crystal data and data-collection statistics of crystals grown at 292 K.

Crystal form I (Fig. 1a) II (Fig. 1b) III (Fig. 1c) IV (Fig. 1d) V (Fig. 1e) VI (Fig. 1f) VII (Fig. 1g)
Reservoir solution 2.4–2.6 M (NH4)2SO4, 0.1 M CHES pH 9.3–9.5 22% PEG 6000, 0.1 M Tris pH 8.0 2.0–2.6 M (NH4)2HPO4, 0.1 M CHES pH 9.2–9.8 2.5 M (NH4)2SO4, 0.1 M CHES pH 9.5 20–24% PEG 6000, 0.1 M Tris pH 8.0 18–26% PEG 6000, 0.1 M Bicine pH 9.0 2.6 M (NH4)2SO4, 0.1 M CHES pH 9.4
Cryocooling condition Paraffin oil (298 K) 20%(v/v) glycerol 10%(v/v) glycerol (298 K) +4% PEG 6000, 20%(v/v) ethylene glycol (298 K)
X-ray source Rotating anode Rotating anode BESSY BL14.3 Rotating anode Rotating anode Rotating anode Rotating anode
Wavelength (Å) 1.5418 1.5418 0.9537 1.5418 1.5418 1.5418 1.5418
Data-collection temperature (K) 100 298 100/298 100 298 100 298
Space group§ P21212 C2 P21 P21 P6x P2x P21212
Resolution limit (Å) 2.4 2.8 1.66/3.2 2.0 3.3 1.9 3.3
Unit-cell parameters              
 a (Å) 98.9 144.5 60.3/61.6 73.8 137.1 92.5 100.2
b (Å) 113.4 57.0 135.8/138.5 92.1 137.1 98.4 122.7
c (Å) 91.3 72.8 72.6/73.1 92.6 107.0 115.0 93.5
 β (°)   110.3 92.1/92.5 111.0   95.8  
VM3 Da−1) 2.4 2.7 2.8/2.9 2.8 2.7 2.4 2.7
Solvent content (%) 49 53 56/58 56 55 49 55
Molecules per ASU 2 1 2 2 2 2 2
Total reflections 580367 24381 688456 594606 n.d. n.d. 30538
Unique reflections 40831 11502 129723 71898 n.d. n.d. 14143
Completeness (%) 99.9 (99.7) 82.7 (62.4) 94.5 (95.3) 92.0 (97.7) n.d. n.d. 79.2 (72.9)
Rsym 7.6 (24.8) 6.7 (17.1) 5.0 (48.5) 5.8 (23.0) n.d. n.d. 15.5
Rp.i.m.†† 2.1 (12.8) 5.0 (15.2) 2.3 (23.6) 2.1 (17.5) n.d. n.d. 37.6

CHES, N-cyclohexyl-2-aminoethanesulfonic acid.

Unit-cell parameters and the V M values correspond to data sets at the two given temperatures. Data-processing statistics are only listed for the synchrotron data collected at 100 K.

§

x, possible screw axes could not be determined owing to insufficient data.

R sym = Inline graphic Inline graphic.

††

R p.i.m. = Inline graphic Inline graphic. R p.i.m. describes the precision of merged reflections by incorporation of the multiplicity N (Weiss, 2001).