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. 2002 Feb;11(2):401–408. doi: 10.1110/ps.34102

Table 1.

Data collection and refinement statistics

Synchrotron Laboratory source
a, b, c (Å); β(°) 72.51, 72.36, 67.09, 118.17 62.69, 71.98, 62.68, 113.06
Space group C2 C2
Resolution (Å) 30–2.70 30–2.25
Mosaicity (°) 1.50 1.25
Wavelength (Å) 0.9796a 0.9795b 0.9400c 1.54178
Completeness (%)a 85 (74) 84 (72) 91 (85) 98.9 (96.2)
Redundancya 0.85 (0.78) 0.84 (0.72) 0.90 (0.86) 2.3 (1.8)
Unique reflections 13302 13254 14192 22062
I/σIa 7.9 (1.8) 8.4 (1.5) 9.2 (1.9) 11.2 (3.9)
Rmerge (%)a 9.1 (61.0) 10.0 (63.2) 8.2 (55.0) 6.0 (22.1)
Anomalous differences (%) 9.0 8.2 7.1 3.3
Dispersive differences (%) 3.3peak−inflection; 5.4peak−remote; 4.1remote−peak
Figure of meritb 0.53 (0.79)
Rcryst,Rfreeb (%) 19.8, 23.8
Number of parameters 7387
Number of restraints 7258
Parameter/data ratio 3.96
Root mean square deviation Bond (Å) Angle (°) Dihedral (°) Planarity (Å)
0.007 1.4 16.5 0.03
Mainchain Sidechain Solvent
Number of atoms 241 962 881 67
Average B-factors (Å2) 27.3 28.2 38.4 37.0

a Highest resolution shell data is shown in parentheses.

b FOM after density modification with noncrystallographic symmetry averaging is shown in parentheses.

c Randomly selected 8% of the reflections.