Table 1.

Developmental changes in properties of synaptic connections and input resistance

Age	P14–16	P17–20	P24–29
Unitary EPSP (mV)	1.11 ± 1.01 (n = 29)	1.24 ± 1.28 (n = 27)	0.65 ± 0.77 (n = 24)*
Coefficient of variation	0.38 ± 0.20 (n = 29)	0.30 ± 0.16 (n = 26)	0.54 ± 0.20 (n = 24)**
Failure rate (%)	2.39 ± 4.08 (n = 29)	1.44 ± 3.29 (n = 22)	10.61 ± 8.68 (n = 22)**
PPR (%) (EPSP2/EPSP1× 100)	70.1 ± 16.6 (n = 16)	82.6 ± 10.8 (n = 17)*	103.8 ± 32.5 (n = 21)**
PPR (%) (EPSP3/EPSP1× 100)	60.2 ± 15.7 (n = 16)	66.9 ± 10.9 (n = 17)	98.3 ± 29.8 (n = 21)**
20–80% Rise time (ms)	1.84 ± 0.48 (n = 19)	1.35 ± 0.54 (n = 23)*	1.61 ± 0.36 (n = 11)
Decay time constant (ms)	25.9 ± 6.9 (n = 19)	17.8 ± 4.5 (n = 18)**	20.4 ± 7.4 (n = 12)*
Latency (ms)	1.24 ± 0.44 (n = 16)	1.07 ± 0.40 (n = 20)	1.15 ± 0.45 (n = 9)
Input resistance (MΩ)	144 ± 57 (n = 37)	90 ± 30 (n = 33)**	83 ± 28 (n = 28)**

Asterisks indicate statistically significant difference from the P14–16 age group (

^*P < 0.05,

^**P < 0.005).