Skip to main content
. 2008 Apr 1;5(24):671–690. doi: 10.1098/rsif.2008.0052

Table 1.

Comparison of common micromanipulation tools for single cellsa. (AFM, atomic force microscopy; MT, magnetic tweezers; DEP, dielectrophoresis; OT, optical tweezers.)

tools principle type length-scale probe (nm) typical force range (pN) stiffness (pN nm−1) advantages disadvantages
scanning probes AFM a sharp tip normal to the free end of a cantilever point; contact 1–10 000 5–10 000 10–10 000 active force clamp single cell needs to adhere tightly to a surface; random attachment
field gradient traps MT electromagnetic field gradients; magnetic beads that are attached to single cell surface global/point; non-contact 10–10 000 0.05–20 10−6– 0.1 constant force; angular force for out-of-plane rotation of single cell magnetic beads to covalent or specific non-covalent attached to cells
DEP high-gradient electric field; cell dielectric properties and the surrounding medium global; non-contact 20–100 000 0.01–50 simple operation heating; two-dimensional trap
OT A highly focused beam to produce optical gradient; cell refraction index point; non-contact 0.1–1000 0.1–100 10−6– 0.1 non-contact force; active or passive force clamp; well-defined geometries photodamage or thermal damage
a

Some data are cited from Greenleaf et al. (2007).