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. 2008 Apr 7;52(6):2053–2060. doi: 10.1128/AAC.01456-07

TABLE 1.

Data collection and refinement statistics

Data set Value for indicated complex:f
PBP 2X-biapenem PBP 2X-tebipenem PBP 1A-biapenem PBP 1A-tebipenem
Unit cell parameters
    a (Å) 106.79 107.31 185.70 185.75
    b (Å) 171.91 172.06 50.67 50.28
    c (Å) 88.67 88.80 110.78 109.54
Data collection statisticsa
    Resolution (Å) 2.50 (2.58-2.50) 2.80 (2.90-2.80) 3.00 (3.11-3.00) 2.70 (2.80-2.70)
    Total no. of reflections 282,689 231,874 73,665 131,215
    No. of unique reflections 53,714 41,099 19,127 29,074
    Completeness (%) 92.7 (90.1) 99.7 (99.1) 88.1 (91.5) 100.0 (99.6)
    Redundancy 5.3 (4.8) 5.6 (5.3) 3.9 (3.6) 4.5 (4.3)
    Rmergeb (%) 5.9 (22.8) 7.0 (24.0) 13.0 (35.0) 12.3 (36.4)
     <I/σ(I)>c 18.9 (5.5) 14.4 (4.9) 6.2 (2.8) 7.2 (2.7)
Refinement statistics
    Total no. of atoms 10,016 9,786 6,362 6,398
    Rcrystd (%) 23.5 22.5 22.2 22.8
    Rfreee (%) 28.1 27.4 27.6 27.1
    RMSD from ideal
        Bond length (Å) 0.007 0.007 0.007 0.007
        Bond angle (°) 1.0 1.0 1.0 1.0
    Avg B factor (Å2) 48.0 60.0 50.5 42.0
    Ramachandran plot
        Most favored (%) 88.4 87.4 87.1 89.9
        Additional allowed (%) 11.0 12.1 12.5 9.5
        Generously allowed (%) 0.2 0.5 0.4 0.6
        Disallowed (%) 0.4 0.0 0.0 0.0
a

Values in parentheses are for the shell with the highest resolution.

b

Rmerge = ΣhklΣi|Ihkl,i − <Ihkl>|/ΣhklΣi<Ihkl>, where Ihkl,i represents the ith measurement of the intensity of the hkl reflection and its symmetry equivalent and <Ihkl> is the average intensity of the hkl reflection.

c

Averages of the diffraction intensities divided by their standard deviations.

d

Rcryst = ΣhklFo| − |Fc‖/Σhkl|Fo|, where |Fo| and |Fc| are the observed and calculated structure factor amplitudes, respectively, for reflection hkl.

e

Rfree is the same as Rcryst for a random 5% of reflections excluded from refinement.

f

All complexes are in space group P21212.