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. Author manuscript; available in PMC: 2008 Nov 12.
Published in final edited form as: Opt Express. 2008 May 12;16(10):6941–6956. doi: 10.1364/oe.16.006941

Fig. 7.

Fig. 7

Trapping of a 100 nm bead in the hardware-feedback ABEL trap. a) Image of a trapped bead obtained by averaging 11 video frames (corresponding to 1 s of data). b) Histogram of voltages applied along the x-axis to keep the bead trapped. c) Impulse response function of the feedback electronics. The latency is dominated by the cruddy SR844 lock-in amplifier. d) Power spectrum of the voltage oscillations (blue), and fits based on Eq. 5 including the effect of measurement noise (red), and without measurement noise (black).