Fig. 6.

Time-dependent growth of structural crystallinity. (Left) The fraction (circles) versus time gives the kinetic profile of the transformation. (Inset) Zoomed out kinetics over a longer time scale. The “averaged” exponential-rise fit of τ = 880 ns is depicted (solid line) in Inset. (Upper Right) Single-pulse diffraction pattern of single-crystal silicon taken with the incident electron beam parallel to the [011] zone axis. The single crystal on a grid was obtained (Mag*I*Cal Calibration Sample, SPI) and used as received. (Lower Right) Two time frames of diffraction difference at the time delays indicated. Referencing to the pattern at negative time, the frame at t = −10 ps displays no pattern, whereas the one at t = +10 ps shows the surface melting because of the ultrafast phase transition of the amorphous solid to the liquid phase (10). In the kinetic profile of crystallization, we note both the (averaged) exponential rise and the structured one (see text).