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. 1997 Nov 11;94(23):12303–12308. doi: 10.1073/pnas.94.23.12303

Table 1.

Crystallographic and refinement statistics

Data set Resolution, Å Unique reflections Redundancy Completeness, % Rmerge, % Riso, % PP PPano Rcullis, % FOM, %
Native 2.4 2481 8.9 99.6 5.7
K2PtCl4 3.1 1116 6.9 100.0 7.0 21.6 1.69 0.38 0.70 40.9
to 3.5 Å
Mutant 2.5 2143 6.9 99.6 6.1 13.9
K2PtCl4 3.1 1106 9.4 99.8 9.3 25.9 1.46 0.76 32.0

Rmerge = 100 × ΣhΣi|Ii(h) − 〈I(h)〉|/ΣhΣiIi(h), where Ii(h) and 〈I(h)〉 are the ith and mean measurement of the intensity of reflection h. 

Riso = Σ|FphFp|/ΣFp, where Fph and Fp are derivative and native structure factor amplitudes, respectively. 

PP (phasing power) = 〈Fh〉/E, where 〈Fh〉 is the rms heavy atom structure factor amplitude and E is the residual lack of closure error. 

Rcullis (Cullis R factor) = Σ∥Fph ± Fp| − Fh(calc)|/Σ|Fph ± Fp|, where Fh(calc) is the calculated heavy atom structure factor amplitude. 

FOM, the mean figure of merit.