TABLE 1.

Thresholding artifacts in traditional SMD versus CICS

	Traditional SMD		CICS
Threshold (counts)	Burst rate/100 s	Burst height (counts)	Burst rate/100 s	Burst height (counts)
20	421	149 ± 199	958	101 ± 24
30	305	197 ± 216	906	105 ± 14
40	257	227 ± 223	906	105 ± 14
50	224	254 ± 226	906	105 ± 14
60	206	272 ± 229	906	105 ± 14
70	183	298 ± 229	903	105 ± 14

Analysis of 100-s Monte Carlo simulation data. The digital nature of fluorescence bursts acquired using CICS allows the system to be robust against thresholding artifacts. However, quantitative burst parameters determined using traditional SMD are highly sensitive to the specific threshold applied. Bin time, 0.1 ms.