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. Author manuscript; available in PMC: 2008 Dec 13.
Published in final edited form as: J Phys Chem B. 2007 Nov 16;111(49):13797–13806. doi: 10.1021/jp075051y

Table 3.

Contact frequency (in percentage) of each residue with the surface

Arg1 His2 Ser3 Val4 Val5
Simulation A 20.0 37.8 37.8 53.9 73.9
Cluster A1 4.0 64.9 69.3 52.6 72.7
Cluster A2 31.4 18.0 15.4 56.8 73.7
Simulation B 13.9 22.6 21.9 61.5 53.5
Cluster B1 5.1 31.8 26.5 59.0 51.7
Cluster B2 38.0 0.6 25.0 72.7 42.5
Simulation C 16.0 18.0 5.7 50.9 50.1
Cluster C1 9.7 11.1 8.0 48.5 58.6
Cluster C2 21.7 24.7 2.8 54.5 41.1